LINEAR FEEdback shift register FOR TESTING

230000015654 memory Effects 0.000 claims abstract description 162.Assignors: PARK, JIN-YOUNG, KIM, HEON CHEOL Priority to DE60116046T priority patent/DE60116046T2/en Priority to EP01305658A priority patent/EP1241678B1/en Publication of US20020138800A1 publication Critical patent/US20020138800A1/en Application granted granted Critical Publication of US6769084B2 publication Critical patent/US6769084B2/en Adjusted expiration legal-status Critical Status Expired - Fee Related legal-status Critical Current Links ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). reassignment SAMSUNG ELECTRONICS CO., LTD. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.) Filing date Publication date Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd Priority to US09/805,431 priority Critical patent/US6769084B2/en Priority to KR10-2001-0028709A priority patent/KR100410872B1/en Assigned to SAMSUNG ELECTRONICS CO., LTD. Original Assignee Samsung Electronics Co Ltd Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.) ( en Inventor Heon Cheol Kim Jin-Young Park Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.) Expired - Fee Related, expires Application number US09/805,431 Other versions US20020138800A1

Google Patents Built-in self test circuit employing a linear feedback shift registerĭownload PDF Info Publication number US6769084B2 US6769084B2 US09/805,431 US80543101A US6769084B2 US 6769084 B2 US6769084 B2 US 6769084B2 US 80543101 A US80543101 A US 80543101A US 6769084 B2 US6769084 B2 US 6769084B2 Authority US United States Prior art keywords data adb address lfsr memory Prior art date Legal status (The legal status is an assumption and is not a legal conclusion. Google Patents US6769084B2 - Built-in self test circuit employing a linear feedback shift register

US6769084B2 - Built-in self test circuit employing a linear feedback shift register

LINEAR FEEdback shift register FOR TESTING